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商品名稱: Crystal Impact Match v1.11a
商品分類: 工程繪圖、計算、分析軟體
商品類型: 粉末衍射資料階段識別軟體
語系版本: 英文正式版
運行平台: Windows XP/Vista/7
更新日期: 2011-11-26
破解說明:
關掉主程式,破解檔放置於crack夾內,請將破解檔複製於主程式的安裝目錄內既可破解
內容說明:
Crystal.Impact.Match.v1.11是一款易用的粉末衍射資料階段識別軟體。通過把
樣本的粉末衍射形態與資料庫中的參考形態進行比較,來確定樣本所在階段。通
過提升ICSD(無機晶體結構資料庫)的檢索效率,提高參考模式資料庫的價值。
英文說明:
Match! is an easy-to-use software for phase identification from powder
diffraction data, which has become a daily task in material scientists
work. Match! compares the powder diffraction pattern of your sample to
a database containing reference patterns in order to identify the phases
which are present. Single as well as multiple phases can be identified
based on both peak data and raw (profile) data.
As reference database, you can apply the included free-of-charge
IUCr/COD/AMCSD database and/or ICSD/Retrieve (if you have a valid
licence), use any ICDD PDF product, and/or create a user database based
on your own diffraction patterns. The user database patterns can be edited
manually, imported from peak files, calculated from crystal structure data
(e.g. CIF files), or imported from your colleague's user database.
圖片說明:
![](softimage/CAM1613.jpg)
商品名稱: Crystal Impact Match v1.11a
商品分類: 工程繪圖、計算、分析軟體
商品類型: 粉末衍射資料階段識別軟體
語系版本: 英文正式版
運行平台: Windows XP/Vista/7
更新日期: 2011-11-26
破解說明:
關掉主程式,破解檔放置於crack夾內,請將破解檔複製於主程式的安裝目錄內既可破解
內容說明:
Crystal.Impact.Match.v1.11是一款易用的粉末衍射資料階段識別軟體。通過把
樣本的粉末衍射形態與資料庫中的參考形態進行比較,來確定樣本所在階段。通
過提升ICSD(無機晶體結構資料庫)的檢索效率,提高參考模式資料庫的價值。
英文說明:
Match! is an easy-to-use software for phase identification from powder
diffraction data, which has become a daily task in material scientists
work. Match! compares the powder diffraction pattern of your sample to
a database containing reference patterns in order to identify the phases
which are present. Single as well as multiple phases can be identified
based on both peak data and raw (profile) data.
As reference database, you can apply the included free-of-charge
IUCr/COD/AMCSD database and/or ICSD/Retrieve (if you have a valid
licence), use any ICDD PDF product, and/or create a user database based
on your own diffraction patterns. The user database patterns can be edited
manually, imported from peak files, calculated from crystal structure data
(e.g. CIF files), or imported from your colleague's user database.
圖片說明:
![](softimage/CAM1613.jpg)
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